Access Information

• All new users must be trained and approved by the facility manager to use the equipment in the facility.
• All users must obtain the financial approval from their PI and financial manager. Please submit a PO number or the Harvard billing code prior to the first use of the facility.
• Approved users can sigh up with the facility manager.
• Contact: Rebecca Stearns, stearreb@hsph.harvard.edu, 617-432-1667

Equipment 

Carl Zeiss EM902 EFTEM

 Description

 Energy Filtering Transmission Electron Microscope (EFTEM)

 Features 

 1. Integrated electron energy spectrometer

 2. Integrated image analysis using Soft Imaging System software

 3. Electron Spectroscopic Imaging (ESI)

 4. Electron Energy Loss Spectroscopy (EELS)

 5. Conventional Transmission Electron Microscopy (CTEM) 

Accessory

 Ultra Microtome (Reichert-Jung, Ultracut E) 

Carl Zeiss 1450 VP SEM

 

 Description

 Scanning Electron Microscope (SEM)

 Features 

 1. Integrated Inca300/SEM Si(Li) X-ray detector and X-ray

 2. INCA and ISIS analysis systems

 3. Leo-32 image analysis system

 Accessories

 1. Critical Point Drier (CPD) (Tousimis, Smdri-PVT-3B)

 2. Sputter Coater (Anatech, Hummer V)